DOSIMETRIC PROPERTIES OF THE NEW TLD ALBEDO NEUTRON DOSEMETER AWST-TL-GD 04
List of Participants - Department of Computer Science
Contribution of interface traps to valence band electron tunneling in PMOS devices
arXiv:1210.7933v1 [physics.ins-det] 30 Oct 2012
EURADOS INTERCOMPARISONS FOR INDIVIDUAL MONITORING SERVICES: RESULTS AND CONCLUSIONS FROM THE FIRST THREE EXERCISES
Diffusion of Niobium in Congruent Lithium Niobate
Modern Gas Sensors Allow Innovation
Travel directions to Siemens Corporate Research and Technology Otto-Hahn-Ring 6, 81739 München, Germany +49 89 636 48724 (Olive
PDF) MDA Applied: From Sequence Diagrams to Web Service Choreography
HyperMSCs with Connectors for Advanced Visual System Modelling and Testing
Radiation Hard Strip Detectors on Oxygenated Silicon
Defects Due to Metal Silicide Precipitation in Microelectronic Device Manufacturing: The Unlovely Face of Transition Metal Silic
Spatial Resolution Smaller Than the Pixel Size? Yes we can! | Microscopy and Microanalysis | Cambridge Core
EUV blank inspection - AMTC Advanced Mask Technology Center ...
Atos - Infineon Technologies
Network of Excellence
How New Electron Detector Concepts Can Help to Increase Throughput and Sensitivity of Single-and Multi-Beam Scanning Electron Microscopes | Microscopy and Microanalysis | Cambridge Core
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How New Electron Detector Concepts Can Help to Increase Throughput and Sensitivity of Single- and Multi-Beam Scanning Electron M
Multichannel Silicon Drift Detectors for High Speed, High Resolution X-ray Spectroscopy Applications
Adaptive middleware for real-time prescriptive analytics in large scale power systems
arXiv:1205.5305v1 [physics.ins-det] 23 May 2012
Direct Single-Electron Imaging using a pnCCD Detector
arXiv:1112.5395v2 [physics.ins-det] 5 Mar 2012
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